Vol. 336 No. 5 (2025)

DOI https://doi.org/10.18799/24131830/2025/5/5122

"Microfocus" is the first Russian beamline for combining X-ray coherent and incoherent methods for application in geology and geochemistry

Synchrotron radiation facility «SKIF» with an ultra-low electron beam emittance opens up broad prospects for the use of undulator radiation in geological and geochemical studies. The increase in the radiation brightness allows one to implement coherent (phase-sensitive) high-resolution microscopy methods, including ptychography and ptychotomography. It becomes possible to study the fine structure of micro-objects (inclusions, mineral grains, etc.) with nanometer-scale spatial resolution, which allows for reconstruction of the complex geological histories of minerals associated with the formation of various rocks. Two- and three-dimensional traditional and confocal X-ray fluorescence micromapping provides complementary information on the chemical composition of minerals and inclusions, and allows one to identify the individual phases. The combination of confocal fluorescence microscopy and XANES microspectroscopy will provide additional information on the local structure and valence of elements at the study point, solving the problem of express restoration of the mineral composition of ores and sediments. In addition, in situ methods of single-crystal microdiffraction in diamond anvils are becoming available, which are relevant for studying high-pressure phase transitions and reactions, including deep ore formation processes. The paper describes an updated project of the 1-1 "Microfocus" undulator-based beamline of SRF «SKIF», including a set of implemented experimental methods, a coordinated X-ray optical layout, operational modes, experimental scenarios and expected parameters of radiation beams at the sample. The authors substantiated optical and thermal-mechanical solutions, estimated achievable spatial resolutions. The paper demonstrates feasibility of combining "coherent" and "traditional" methods in the hard X-ray range, i. e. "multimodality" of the beamline.

Keywords:

microdiffraction, confocal fluorescence microscopy, spectro-microscopy, micro-XANES, ptychography

Authors:

Yakov V. Rakshun

Yuri V. Khomyakov

Egor I. Glushkov

Alexey S. Gogolev

Maxim V. Gorbachev

Andrey V. Darin

Fedor A. Darin

Igor P. Dolbnya

Sergey V. Rashchenko

Vladimir A. Chernov

Nikolay I. Chkhalo

Marat R. Sharafutdinov